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Vermont EPSCoR Publications

Found 3 results
Filters: Author is Xia, Tian  [Clear All Filters]
Smith JR, Xia T. High-Resolution Delay Testing of Interconnect Paths in Field-Programmable Gate Arrays. IEEE Transactions on Instrumentation and Measurement [Internet]. 2009;58(1):187 - 195. Available from:
Zheng H, Ahrens J, Xia T. A Compositional Method With Failure-Preserving Abstraction for Asynchronous Design Verification. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems [Internet]. 2008;27(7):1343 - 1347. Available from:
Erturk M, Xia T, Clark WF. Gate Voltage Dependence of MOSFET Noise Statistics. IEEE Electron Device Letters [Internet]. 2007;28(9):812 - 814. Available from: